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Recent improvements in the integration of field emitters into scanning probe microscopy sensors

Poster at MNE 2007, 33rd International Conference on Micro- and Nano-Engineering 2007, Copenhagen, Denmark
 
: Beuer, S.; Rommel, M.; Petersen, S.; Amon, B.; Sulzbach, T.; Engl, W.; Bauer, A.J.; Ryssel, H.

:
Fulltext urn:nbn:de:0011-n-832063 (7.9 MByte PDF)
MD5 Fingerprint: ee7aeff8000ab965755195d6fa1bdc68
Created on: 5.11.2008


2007, 1 Folie
International Conference on Micro- and Nano-Engineering (MNE) <33, 2007, Copenhagen>
English
Poster, Electronic Publication
Fraunhofer IISB ()
integrated field emitter; SPM sensor; EBID carbon

: http://publica.fraunhofer.de/documents/N-83206.html