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Measuring the spatiotemporal electric field of tightly focused ultrashort pulses with sub-micron spatial resolution

 
: Bowlan, P.; Fuchs, U.; Gabolde, P.; Trebino, R.; Zeitner, U.D.

:
Postprint (896 KByte; PDF; )

Optics Express 16 (2008), No.18, pp.13663-13675
ISSN: 1094-4087
English
Journal Article, Electronic Publication
Fraunhofer IOF ()
femtosecond laser-pulse; spectral interferometry; optical microscopy; lens system; real-time; distortion

Abstract
We demonstrate a powerful and practical spectral interferometer with near-field scanning microscopy (NSOM) probes for measuring the spatiotemporal electric field of tightly focused ultrashort pulses with high spatial and spectral resolution. Our measurements involved numerical apertures as high as 0.44 and yielded the spatiotemporal field at and around the foci produced by two microscope objectives and several different lenses. For the first time, we measure the spatiotemporal field of the Bessel-like X-shaped pulse caused by spherical aberrations and a "fore-runner pulse" due to chromatic aberrations. We observed spatial features smaller than 1 mu m and verified these results with non-paraxial simulations.

: http://publica.fraunhofer.de/documents/N-83174.html