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Recent developments in electron tomography - Possibilities and a few limitations

 
: Kübel, C.

:

Microscopy and microanalysis 13 (2007), Supplement S02, pp.152-153
ISSN: 1431-9276
English
Journal Article
Fraunhofer IFAM ()

: http://publica.fraunhofer.de/documents/N-82885.html