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Title
Verfahren und Vorrichtung zur Dickenmessung
Date Issued
2006
Author(s)
Schmitt, P.
Kostka, G.
Patent No
102006059415
Abstract
(A1) Die Materialstaerke ausgedehnter Objekte kann dadurch effizient bestimmt werden, dass zwei Abstandsmesseinrichtungen verwendet werden, wobei eine erste Abstandsmesseinrichtung den Abstand zu einer ersten Hauptoberflaeche des Objekts und eine zweite Abstandsmesseinrichtung den Abstand zu einer zweiten Hauptoberflaeche des Objekts, die der ersten Hauptoberflaeche gegenueberliegt, bestimmt. Werden potentielle Messfehler aufgrund der ausgedehnten Geometrie dadurch vermieden, dass eine Referenzeinrichtung einen Referenzabstand zwischen der ersten Abstandsmesseinrichtung und der zweiten Abstandsmesseinrichtung bestimmt, kann mit hoher Genauigkeit und Geschwindigkeit die Dicke des Objekts zwischen der ersten Hauptoberflaeche und der zweiten Hauptoberflaeche bestimmt werden.
WO 2008071337 A1 UPAB: 20080711 NOVELTY - The arrangement has first and second distance measurement devices (26,28) for determining first and second distances (32a,32b) to first and second opposing main surfaces of the object (20) in a measurement direction, an x-ray device (30a) for determining a first material thickness from the attenuation of x-rays passing through the object and an evaluation device for determining the material thickness (22) between the first and second main surface using the first and second distances and the first material thickness. DETAILED DESCRIPTION - AN INDEPENDENT CLAIM is also included for a method of measuring the material thickness of an object. USE - For measuring the material thickness of an object, especially of strip material such as sheet, film or paper. ADVANTAGE - Enables efficient thickness measurement. WO 2008071338 A1 UPAB: 20080707 NOVELTY - Measuring device comprises a reference object (40a, 40b) arranged between a first reference main surface and a second reference main surface, a first distance measuring unit (26) for determining a first distance between the first distance measuring unit and a first main surface of the object (20) being measured, a second distance measuring unit (28) for determining a second distance between the second distance measuring unit and a second main surface of the object and an evaluating unit for determining the material thickness of the object. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a method for determining the material thickness of an object using the above device. Preferred Features: The measuring direction if perpendicular to the first main surface of the object being measured. USE - Measuring device for determining the material thickness of an object. ADVANTAGE - The measuring device is efficient.
Language
de
Patenprio
DE 102006059415 A: 20061215