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Characterization and comparison of direct and indirect converting X-ray detectors for non destructive testing (NDT) in low energy and high resolution applications

: Uhlmann, N.; Salamon, M.; Sukowski, F.; Voland, V.


Michel, T.:
Radiation imaging detectors 2007. Proceedings of the 9th International Workshop on Radiation Imaging Detectors : Erlangen, Germany, July 22 - 26, 2007 ; 9th iWORID
Amsterdam: Elsevier, 2008 (Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment 591.2008, Nr.1)
International Workshop on Radiation Imaging Detectors (IWORID) <9, 2007, Erlangen>
Conference Paper, Journal Article
Fraunhofer IIS ()

Recent developments of direct converting X-ray detectors with good efficiency in the lower (10 keV) to the higher (4200 keV) energy ranges will become more and more of interest for applied non-destructive testing purposes. In this publication, we present different tests for characterization and comparison of detectors used in low-energy and high-resolution radioscopic and computed tomography applications. The characterization and application tests were performed on the direct converting X-ray detector Ajat DIC 100TL (Oy AJAT Ltd.) which is based on CdTe with a CMOS readout and the indirect converting X-ray detector C9311DK (Hamamatsu) which is based on CsI with a CMOS readout. The results of different characterization criteria on one hand valid for all detector types and applications like basic spatial resolution (BSR), MTF, SNR and efficiency and on the other hand criteria especially for NDT in designated application fields are presented and compared for the two detectors.