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Thermo-mechanical reliability of 3D-integrated microstructures in stacked silicon

: Wunderle, B.; Mrossko, R.; Wittler, O.; Kaulfersch, E.; Ramm, P.; Michl, B.; Reichl, H.

Bower, C.A. ; Materials Research Society -MRS-:
Enabling Technologies for 3-D Integration : Symposium held November 27-29, 2006, Boston, Massachusetts, U.S.A.
Pittsburgh, Pa.: MRS, 2007 (Materials Research Society symposia proceedings 970)
ISBN: 1-558-99927-2
ISBN: 978-1-558-99927-5
Symposium Y "Enabling Technologies for 3-D Integration" <2006, Boston/Mass.>
Materials Research Society (Fall Meeting) <2006, Boston/Mass.>
Conference Paper
Fraunhofer IZM ()

This paper investigates the thermo-mechanical reliability of inter-chip-vias (ICV) for 3D chip stacking after processing and under external thermal loads relevant for the envisaged field of application (mobile, automotive) by Finite Element simulation. First the materials are characterised by nano-indentation to determine elasto-plastic data. Finite Element simulations are used to reproduce these data and to extract local material properties like E-modulus and yield stress. Accumulated plastic strain is used as failure indicator under periodic thermal loading of an ICV. Geometrical, material and process-related parameters are varied to obtain first design guidelines for this new technology. The locations of stress and strain accumulation are given.