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Noise propagation for induced fast transient impulses on PCB-level

 
: Taki, M.; John, W.; Hedayat, C.; Hilleringmann, U.

:

Institute of Electrical and Electronics Engineers -IEEE-:
18th International Zurich Symposium on Electromagnetic Compatibility, EMC 2007 : Munich, Germany, 24-28 Sept. 2007
Piscataway, NJ: IEEE Service Center, 2007
ISBN: 978-3-9523286-0-6
pp.57-60
International Symposium on Electromagnetic Compatibility (EMC) <18, 2007, München>
English
Conference Paper
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-74925.html