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  4. Test design patterns for embedded systems
 
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2007
Conference Paper
Title

Test design patterns for embedded systems

Author(s)
Zander-Nowicka, J.
Marrero Perez, A.
Schieferdecker, I.
Dai, Z.R.
Mainwork
Business Process Engineering  
Conference
International Conference on Quality Engineering in Software Technology (CONQUEST) 2007  
Language
English
Fraunhofer-Institut für Offene Kommunikationssysteme FOKUS  
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