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Test design patterns for embedded systems
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2007
Conference Paper
Title
Test design patterns for embedded systems
Author(s)
Zander-Nowicka, J.
Marrero Perez, A.
Schieferdecker, I.
Dai, Z.R.
Mainwork
Business Process Engineering
Conference
International Conference on Quality Engineering in Software Technology (CONQUEST) 2007
Language
English
Fraunhofer-Institut für Offene Kommunikationssysteme FOKUS