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Application of illuminated lock-in thermography to industrial silicon solar cells
urn:nbn:de:0011-n-735011 (361 KByte PDF)
MD5 Fingerprint: bd42401b758babda598d718d8efd8b1e
Created on: 21.9.2012
|European Commission, Joint Research Centre -JRC-:|
The compiled state-of-the-art of PV solar technology and deployment. 22nd European Photovoltaic Solar Energy Conference, EU PVSEC 2007. Proceedings of the international conference. CD-ROM : Held in Milan, Italy, 3 - 7 September 2007
München: WIP-Renewable Energies, 2007
|European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <22, 2007, Milano>|
| Conference Paper, Electronic Publication|
|Fraunhofer ISE ()|
Illuminated lock-in thermography (ILIT) was introduced for spatially resolved measurement of the local power dissipation in a solar cell. For this paper, industrial silicon solar cells were processed and ILIT images taken after each process step, starting with the emitter diffusion. Non ideal processing during the wafer texturization, the contact firing and the laser edge isolation was intentionally applied in order to show the influence of the various dissipation channels in ILIT images. As a result, it is shown that edge shunts due to low laser edge isolation quality are only visible in ILIT MPP images if the global Rp is lower than approximately 1 k ohm cm2.