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Accuracy of inline IV measurements under industrial conditions

 
: Krieg, A.; Weil, A.; Schäffer, E.; Hohl-Ebinger, J.; Warta, W.; Rein, S.

:
Fulltext urn:nbn:de:0011-n-734924 (275 KByte PDF)
MD5 Fingerprint: 77814733c824501f34a8ce51a0286197
Created on: 21.9.2012


European Commission, Joint Research Centre -JRC-:
The compiled state-of-the-art of PV solar technology and deployment. 22nd European Photovoltaic Solar Energy Conference, EU PVSEC 2007. Proceedings of the international conference. CD-ROM : Held in Milan, Italy, 3 - 7 September 2007
München: WIP-Renewable Energies, 2007
ISBN: 3-936338-22-1
pp.368-371
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <22, 2007, Milano>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()

Abstract
In this paper the precision of the current measurement of an inline IV-tester with flash lamp is determined. To evaluate the repeatability and the impact of cell positioning on the overall repeatability a group of equally processed mc-Si solar cells was used. These measurements show that the contacting has a very small influence on the repeatability of the short circuit current measurements, which demonstrates the precision of the automation. To investigate the influence of the spectral mismatch as calculated from the spectral irradiance data supplied by the manufacturer on the absolute value of the short circuit current, four series of measurements with different reference cells were performed on solar cells processed equally. The measurements show a wide deviation of the absolute values of the short circuit current depending of the reference cell used. These differences cannot be explained by the calculated spectral mismatch alone.

: http://publica.fraunhofer.de/documents/N-73492.html