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Characterization approaches of nanoscale modified plastics

 
: Vogel, D.; Keller, J.; Michel, B.; Holst, M.; Muzic, M.

:

Institute of Electrical and Electronics Engineers -IEEE-:
4th IEEE Conference on Nanotechnology 2004 : 16 - 19 August 2004, Munich, Germany
Piscataway, NJ: IEEE, 2004
ISBN: 0-7803-8536-5
pp.23-25
Conference on Nanotechnology <4, 2004, München>
English
Conference Paper
Fraunhofer IZM ()

Abstract
Miniaturization in automotive electronics forces to reduce the size of filler particles in plastics, even to nano scale dimensions. R&D processes as well as later production quality control demand suitable tools and procedures to characterize nano filler particles in polymeric composites. The authors studied different SFM, FIB and SEM based methods of nano particle detection, imaging and quantification. Different scanning probe microscopy (SPM) modes have been compared to each other and to SEM / FIB imaging with regard to their suitability for nano filler characterization in plastics. The influence of surface finishing by focused ion beam (FIB) smoothing is analyzed with emphasis to subsequent quantitative characterization of filler content and distribution. SEM, FIB and SFM load state images have been utilized to measure deformation fields with nano and subnano resolution. The according nanoDAC method is intended to be used for studying fracture mechanisms in the very vicinity of crack tips in nanoscale modified plastics.

: http://publica.fraunhofer.de/documents/N-68203.html