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Electron tomography of nanostructured materials

 
: Kübel, C.

Verein Deutscher Ingenieure e.V. -VDI-, Kompetenzfeld Nanotechnik:
Nanofair 2006 : New ideas for industry. 5. International Nanotechnology Symposium. November 21-22 2006, Karlsruhe
Düsseldorf: VDI Verlag, 2006 (VDI-Berichte 1940)
ISBN: 3-18-091940-X
ISBN: 978-3-18-091940-9
pp.117-118
International Nanotechnology Symposium (Nanofair) <5, 2006, Karlsruhe>
English
Conference Paper
Fraunhofer IFAM ()

Abstract
Accurate characterization of nanostructured materials is one of the main limitations for the development of new materials for nanotechnology and in failure analysis. Electron microscopy is one of the few techniques available that can both directly image and analyze nanomaterials with nanometer or even atomic resolution. For example, high-resolution TEM and STEM in combination with analytical techniques such as EELS and EDX are routinely used to characterize nanostructured materials. However, even with these techniques, accurate structural analysis and metrology are often difficult to obtain as different features can overlap in a single 2D projection image. In contrast, electron tomography provides a way to overcome these limitations by providing the full 3D structure of the sample morphology with nanometer resolution. In this talk, we will illustrate how electron tomography, which is a relatively new technique, can be used to gain insights into the structure of nanomaterials. For example, in nanocomposites, direct imaging of the 3D structure and distribution of embedded nanoparticles to analyze their shape and connectivity will be discussed. As an example in the nanostructured coatings field, we have analyzed anodization layers used in the corrosion protection of aluminum and directly imaged both the nanoporous structure of the oxide and the penetration of a primer into the pore system.

: http://publica.fraunhofer.de/documents/N-67570.html