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Computer-forgetfulness, cosmic radiation, and an ion-microscope

: Adler, E.; Barak, J.; Fischer, B.E.; Metzger, S.

Nuclear instruments and methods in physics research, Section B. Beam interactions with materials and atoms 146 (1998), No.1-4, pp.587-595
ISSN: 0168-583X
Journal Article
Fraunhofer INT ()
Kernstrahlung; Kernstrahlungseffekte; single event upset; SEU; CMOS; SRAM; latchup; microbeam mapping; ion microscope; cosmic radiation; radiation effect; nuclear radiation; ion microprobe; high-energy heavy-ion beams

After an introduction to the cosmic ray environment, we show why few-MeV heavy ions are suitable to simulate cosmic radiation effects in integrated circuits, and how the sensitive sites for various radiation effects can be localised using an ion microscope and a specially designed, small hardware circuit. As a tutorial for the potential of the microprobe technique we show a series of results obtained for a 2kx8 bit static RAM (HM65162).