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Optoelectronic properties of Photodiodes for the mid- and far-infrared based on the InAs/GaSB/AlSb materials family

Optoelektronische Eigenschaften von Photodioden für das mittlere und ferne Infrarot auf der Grundlage der InAs/GaSB/AlSb Materialklasse
: Fuchs, F.; Bürkle, L.; Hamid, R.; Herres, N.; Pletschen, W.; Sah, R.E.; Kiefer, R.; Schmitz, J.


Brown, G.J. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Photodetectors: Materials and Devices VI : 22 - 24 January 2001, San Jose
Bellingham/Wash.: SPIE, 2001 (SPIE Proceedings Series 4288)
ISBN: 0-8194-3966-5
Conference Photodetectors <6, 2001, San Jose/Calif.>
Photonics West <2001, San Jose/Calif.>
Conference Paper
Fraunhofer IAF ()
infrared photodiode; Infrarotphotodiode; InAs/(GaIn)Sb superlattice; InAs/(GaIn)Sb Übergitter; focal plane array; Bildfeldmatrix

The optoelectronic properties of short-period InAs/(GaIn)Sb superlattices (SLs) grown by molecular beam epitaxy on GaSb substrates are discussed. We report on the optimization of the SL materials properties with special emphasis on the use for infrared detection devices. The materials quality is evaluated by using high resolution x-ray diffraction, atomic force microscopy, and photoluminescence spectroscopy. In- plane magneto-transport investigations were performed applying mobility spectrum analysis. The SL diodes were analyzed performing standard electro-optical measurements. The observation of resonances in the I-V curves in the regime of Zener-tunneling due to Wannier-Stark localization opens a new tool for the electrical investigation of photodiodes with low band gap energy. The status of the processing technology is reported demonstrating the feasibility for the fabrication of 256 X 256 focal plane arrays operating in the 8-to-12 micrometers atmospheric window. In addition, results are given for mid-infrared SL-diodes, grown with lattice matched AlGaAsSb barriers instead in the binary InAs/GaSb SL system.