Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Technology-caused performance limitation of the common-gate LNA

 
: Stücke, T.; Kokozinski, R.; Kolnsberg, S.; Hosticka, B.J.

Institute of Electrical and Electronics Engineers -IEEE-:
ECCTD 2007,18th European Conference on Circuit Theory and Design : August 26-30, Sevilla, Spain
New York, NY: IEEE, 2007
ISBN: 1-4244-1342-7
ISBN: 978-1-4244-1342-3
pp.60-63
European Conference on Circuit Theory and Design (ECCTD) <18, 2007, Sevilla>
English
Conference Paper
Fraunhofer IMS ()
CG-LNA; Technologieeinfluss; Performance Grenze

Abstract
In this paper, the performance limitation of common-gate LNAs (CG-LNAs) caused by short channel effects is presented. The analysis is based on equations, which describes the behavior of the MOSFET including the noise sources in all possible regions of operation. From these equations, the input time constant tau in is defined as one characteristic performance figure of the used CMOS technology. The bias dependent limitation of the noise figure N F and minimum input reflection coefficient min (S 11, dB) is derived in dependence of tau in. The paper shows furthermore the advantage of biasing the CG-LNA in the moderate inversion region.

: http://publica.fraunhofer.de/documents/N-62472.html