Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Reliability characteristics of vertical pin diodes on Si and GaN substrates for high-power applications
: Gupta, Rohit
| Freiburg/Brsg., 2020, 95 pp.
Freiburg/Brsg., Univ., Master Thesis, 2020 |
|
| English |
| Master Thesis |
| Fraunhofer IAF () |