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Reflective surface reconstruction from inverse deflectometric measurements

 
: Penk, D.; Sturm, R.; Seifert, L.; Stamminger, M.; Greiner, G.

:

Farinella, Giovanni M. ; Institute for Systems and Technologies of Information, Control and Communication -INSTICC-, Setubal:
15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications. Proceedings. Vol.4: VISAPP : February 27-29, 2020, Valletta, Malta
Setúbal: SciTePress, 2020
ISBN: 978-989-758-402-2
pp.76-84
International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP) <15, 2020, Valletta>
International Conference on Computer Vision Theory and Applications (VISAPP) <15, 2020, Valetta>
English
Conference Paper
Fraunhofer IIS ()

Abstract
Reconstructing reflective surfaces is a difficult task since most algorithms rely on photometric consistency between multiple views on the target object. However specular reflections are highly view dependent and thus violate this assumption. Previous work therefore often incorporates additional information, like polarization or the distortion of a known pattern, to perform specular surface reconstruction. We present a novel analysis by synthesis approach that defines an optimization problem using samples directly on the reconstructed surface. Based on this framework we describe two different setups for reconstruction, one using a line laser to create a reflection pattern and a second one, that uses point measurements to provide ray-measurement correspondences achieving improved accuracy.

: http://publica.fraunhofer.de/documents/N-596178.html