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Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films



Servet, B. ; European Materials Research Society -EMRS-:
E-MRS 2005 Spring Meeting. Symposium P: Current trends in optical and X-ray metrology of advanced materials for nanoscale devices. Proceedings : Strasbourg, France, 31 May-03 June 2005
Amsterdam: Elsevier, 2006 (Applied surface science 253.2006, Nr.1)
Symposium P "Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices <2005, Strasbourg>
European Materials Research Society (Spring Meeting) <2005, Strasbourg>
Conference Paper, Journal Article
Fraunhofer IISB ()