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Comparison of luminescence imaging and illuminated lock-in thermography on silicon solar cells

 
: Kasemann, M.; Schubert, M.C.; The, M.; Köber, M.; Hermle, M.; Warta, W.

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Applied Physics Letters 89 (2006), No.22, Art. 224102, 3 pp.
ISSN: 0003-6951
ISSN: 1077-3118
English
Journal Article
Fraunhofer ISE ()
Siliciummaterialcharakterisierung

Abstract
Spatially resolved electroluminescence (EL) and photoluminescence (PL) images of solar cells are compared to spatially resolved power loss images obtained by illuminated lock-in thermography (ILIT). A significant difference is shown for a solar cell with shunts, while series resistance and charge carrier recombination cause only minor differences in the images. The PL image of a solar cell with shunts appears highly blurred in the shunted region. The origin of this effect is discussed, and a circuit simulation with an appropriate solar cell model is performed. The authors conclude that the blurring of shunted regions is inherent in the method of EL/PL imaging and that ILIT is advantageous for localizing shunts.

: http://publica.fraunhofer.de/documents/N-59580.html