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Comparative Study of 4H-SiC UV-Sensors with Ion Implanted and Epitaxially Grown p-Emitter

 
: Matthus, C.D.; Erlbacher, T.; Bauer, A.J.; Frey, L.

:

Häublein, Volker ; Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electron Devices Society:
22nd International Conference on Ion Implantation Technology, IIT 2018. Proceedings : 16-21 September 2018, Würzburg, Germany
Piscataway: IEEE, 2018
ISBN: 978-1-5386-6829-0
ISBN: 978-1-5386-6828-3 (Print)
ISBN: 978-1-5386-6827-6
ISBN: 978-1-5386-6830-6
pp.110-113
International Conference on Ion Implantation Technology (IIT) <22, 2018, Würzburg>
English
Conference Paper
Fraunhofer IISB ()

Abstract
In this study, a first detailed comparison of the spectral responsivity and internal quantum efficiency (IQE) of 4H-SiC UV sensors with ion implanted and epitaxially grown p-emitter is presented. Additionally, an analytical device model is implemented. It is evident that radiation damage and defects produced during the ion implantation and subsequent annealing are mainly responsible for the approximately 10% lower IQE for wavelengths smaller than 280 nm. In the device model, these defects correspond to a lower effective minority carrier diffusion length within the p + -emitter for the ion implanted devices. Nevertheless, both emitter technologies are suitable in order to achieve a high sensor performance (peak IQE > 60%).

: http://publica.fraunhofer.de/documents/N-581625.html