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Physical and technical basics

 
: Breitenstein, O.; Warta, W.; Schubert, M.C.

:

Breitenstein, O.; Warta, W.; Schubert, M.C.:
Lock-in Thermography. Third edition : Basics and use for evaluating electronic devices and materials
Cham: Springer Nature, 2018 (Springer Series in Advanced Microelectronics 10)
ISBN: 978-3-319-99824-4 (Print)
ISBN: 978-3-319-99825-1 (Online)
DOI: 10.1007/978-3-319-99825-1
pp.7-62
English
Book Article
Fraunhofer ISE ()

Abstract
First, in Sect. 2.1 the general basics of infrared (IR) thermography are briefly reviewed, which are also applicable to IR camera based lock-in thermography. In Sect. 2.2, the principles of the lock-in technique itself and of its digital realization are described.

: http://publica.fraunhofer.de/documents/N-581378.html