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: Breitenstein, O.; Warta, W.; Schubert, M.C.

:

Breitenstein, O.; Warta, W.; Schubert, M.C.:
Lock-in Thermography. Third edition : Basics and use for evaluating electronic devices and materials
Cham: Springer Nature, 2018 (Springer Series in Advanced Microelectronics 10)
ISBN: 978-3-319-99824-4 (Print)
ISBN: 978-3-319-99825-1 (Online)
DOI: 10.1007/978-3-319-99825-1
pp.179-295
English
Book Article
Fraunhofer ISE ()

Abstract
Some applications of Lock-in Thermography for the investigation of a thermally thin sample (solar cell) and a thermally thick one (IC) were already presented in the examples given in Chap. 5. In the following section we will present some more applications, showing the universal applicability of this technique to different fields of functional diagnostics of electronic components.

: http://publica.fraunhofer.de/documents/N-581377.html