Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Preface to the third edition
| Breitenstein, O.; Warta, W.; Schubert, M.C.:
Lock-in Thermography. Third edition : Basics and use for evaluating electronic devices and materials
Cham: Springer Nature, 2018 (Springer Series in Advanced Microelectronics 10)
ISBN: 978-3-319-99824-4 (Print)
ISBN: 978-3-319-99825-1 (Online)
DOI: 10.1007/978-3-319-99825-1
pp.V-VI |
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| English |
| Book Article |
| Fraunhofer ISE () |