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Measurement accuracy and dependence on external influences of the iPhone X TrueDepth sensor

 
: Breitbarth, A.; Schardt, T.; Kind, C.; Brinkmann, J.; Dittrich, P.-G.; Notni, G.

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Fulltext ()

Rosenberger, M. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Photonics and Education in Measurement Science 2019 : 17-19 September 2019, Jena, Germany
Bellingham, WA: SPIE, 2019 (Proceedings of SPIE 11144)
ISBN: 978-1-5106-2981-3
ISBN: 978-1-5106-2982-0
Paper 1114407, 7 pp.
Conference "Photonics and Education in Measurement Science" <2019, Jena>
English
Conference Paper, Electronic Publication
Fraunhofer IOF ()

Abstract
Depth sensors for three-dimensional object acquisition are widely used and available in many different sizes and weight classes. The measuring method used and the measuring accuracy depend on the task to be performed. The integration of depth sensors in mobile devices such as tablets and smartphones is largely new. The TrueDepth system of the iPhone X shows which measurement accuracies can be achieved with these systems and which areas of application can be achieved in addition to consumer fun. The investigations show that the TrueDepth system of the iPhone X can be used for measuring tasks with accuracies in the millimeter range.

: http://publica.fraunhofer.de/documents/N-574946.html