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3D Stacked DRAM Memories
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2019
Book Article
Titel
3D Stacked DRAM Memories
Author(s)
Weis, Christian
Jung, Matthias
Fraunhofer-Institut für Experimentelles Software Engineering IESE
Wehn, Norbert
Hauptwerk
Handbook of 3D Integration. Design, Test, and Themal Management. Vol.4: Design, Test and Thermal Management of 3D Integrated Circuits
Language
English
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Fraunhofer-Institut für Experimentelles Software Engineering IESE