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Analyzing the Precision of Frequency Modulated Continuous Wave Distance and Thickness Measurements

: Schreiner, N.S.; Sauer-Greff, W.; Urbansky, R.; Friederich, F.

Institute of Electrical and Electronics Engineers -IEEE-; Institution of Engineering and Technology -IET-:
16th European Radar Conference, EuRAD 2019 : 29 September-4 October 2019, Paris
Piscataway, NJ: IEEE, 2019
ISBN: 978-2-87487-057-6
ISBN: 978-2-87487-054-5
ISBN: 978-1-7281-3733-9
European Radar Conference (EuRAD) <16, 2019, Paris>
European Microwave Week (EuMW) <2019, Paris>
Conference Paper
Fraunhofer ITWM ()
distance measurements; thickness measurements; precision; Cramer-Rao lower bound; FMCW; millimeter wave; terahertz

Using millimeter and terahertz waves, novel solutions to nondestructive testing can be realized such as contactless distance and thickness measurements of multilayered dielectrics. Recently, we have presented a signal model based approach for the highly accurate inspection of multilayers which benefits both from frequency and phase information. In this contribution, we derive the theoretical minima of the distance and thickness variances directly considering the dependency of frequency and phase. These limits are compared with simulation and measurement results, applying different signal processing techniques. The highest precision is achieved by our signal model based correlation approach.