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Repeatability of atomic force microscopy measurements of wood cell surface

: Kasal, Bohumil; Li, Juan

Sanaev, Victor G. (Hrsg.) ; Mytischi Branch of Bauman Moscow State Technical University:
International Symposium "Forest complex in the digital economy" 2019. Abstracts : Dedicated to the 100th anniversary of the foundation of Mytishchi Branch of Bauman Moscow State Technical University (ex. Moscow Forest Technical Institute - Moscow State Forest University), December 2-5, 2019, Mytishchi, Russia
Moscow: Scientific technology, 2019
ISBN: 978-5-4443-0194-4
International Symposium "Forest Complex in the Digital Economy" <2019, Mytishchi>
Fraunhofer WKI ()
wood cell; atomic force microscopy; repeatability

Atomic force microscopy (AFM) is a powerful method that can be used to obtain surface properties of areas of several nano-meters. Often a term «adhesion force» is used in conjunction with the measurements. However, no adhesion force as such is measured and the equipment simply gives a measure of an attraction force between a tip of a cantilever (often of an unknown geometry) and the substrate. The wood material suffers from large surface roughness and the measurements of the attraction forces suffer from various errors such as variability within a measurement (for example, a tip can change during the of measurement) and the variability between the measurements caused, for example, by error in locating the measurement area by repeated measurements. This presentation investigates the stability of the method with respect to inherent errors and makes an attempt to demonstrate the repeatability using environmental AFM and statistical analysis of treated and untreated samples due to the temperature change.