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Semi-analytic modeling of chiral metasurface stacks

 
: Sperrhake, J.; Decker, M.; Falkner, M.; Fasold, S.; Kaiser, T.; Staude, I.; Pertsch, T.

:

American Physical Society -APS-; IEEE Photonics Society; Optical Society of America -OSA-, Washington/D.C.:
Conference on Lasers and Electro-Optics, CLEO 2019. Proceedings : San Jose, California, USA, 5-10 May 2019
Piscataway, NJ: IEEE, 2019
ISBN: 978-1-943580-57-6
ISBN: 978-1-72813-718-6
pp.1090-1091
Conference on Lasers and Electro-Optics (CLEO) <2019, San Jose/Calif.>
English
Conference Paper
Fraunhofer IOF ()

Abstract
We analyze the polarization response of a fabricated twisted nano-wire meta-surface stack using a semi-analytic algorithm. This lifts the requirement for rigorous simulations when designing metasurface stacks with specific target functionalities.

: http://publica.fraunhofer.de/documents/N-569128.html