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Polarimetry for photonic integrated circuits

: Baier, M.; Schoenau, A.; Soares, F.M.; Schell, M.

Fulltext ()

Applied Sciences 9 (2019), No.15, Art. 2987, 12 pp.
ISSN: 2076-3417
Journal Article, Electronic Publication
Fraunhofer HHI ()

Photonic integrated circuits (PICs) play a key role in a wide range of applications. Very often, the performance of PICs depends strongly on the state of polarization of light. Classically, this is regarded as undesirable, but more and more applications emerge that make explicit use of polarization dependence. In either case, the characterization of the polarization properties of a PIC can be a nontrivial task. We present a way of characterizing PICs in terms of their full Müller matrix, yielding a complete picture of their polarization properties. The approach is demonstrated by carrying out measurements of fabricated PICs.