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Lock-in Thermography. Third edition

Basics and use for evaluating electronic devices and materials
 
: Breitenstein, O.; Warta, W.; Schubert, M.C.

:

Cham: Springer Nature, 2018, XXI, 321 pp.
Springer Series in Advanced Microelectronics, 10
ISBN: 978-3-319-99824-4 (Print)
ISBN: 978-3-319-99825-1 (Online)
English
Book
Fraunhofer ISE ()
Photovoltaik; Silicium-Photovoltaik; Charakterisierung von Prozess- und Silicium-Materialien; DLIT; photoluminescence; thermography; LIT; ILIT

Abstract
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

: http://publica.fraunhofer.de/documents/N-548852.html