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Approach for a Holistic Optimization from Wafer to PV System

: Mittag, M.; Reise, C.; Wöhrle, N.; Eberle, R.; Schubert, M.; Heinrich, M.

Preprint urn:nbn:de:0011-n-5486972 (512 KByte PDF)
MD5 Fingerprint: 02cd680810dc70bb03b79b3b3706c242
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Created on: 16.8.2019

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 : A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC, 10-15 June 2018, Waikoloa Village, HI, USA
Piscataway, NJ: IEEE, 2018
ISBN: 978-1-5386-8529-7
ISBN: 978-1-5386-8530-3
World Conference on Photovoltaic Energy Conversion (WCPEC) <7, 2018, Waikoloa/Hawaii>
Photovoltaic Specialists Conference (PVSC) <45, 2018, Waikoloa/Hawaii>
Photovoltaic Science and Engineering Conference (PVSEC) <28, 2018, Waikoloa/Hawaii>
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <34, 2018, Waikoloa/Hawaii>
Conference Paper, Electronic Publication
Fraunhofer ISE ()
Photovoltaik; Photovoltaische Module und Kraftwerke; Charakterisierung von Prozess- und Silicium-Materialien; Modultechnologie; Photovoltaische Kraftwerke; CTM; objective; rating; analysis; modelling

Models for the calculation of losses in PV systems are widely applied but typically focus on single components (i.e. the solar cell). We discuss relevant models and combinations thereof to analyze losses from wafer to system. We propose a holistic approach to analyze losses from laboratory to environmental conditions. The proposed approach focusses on practically relevant interfaces (i.e. STC module power) and is based on separated influence factors.