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3D Analysis of Thin Layers by ToF-SIMS

Poster presented at 6th Dresden Nanoanalysis Symposium "Materials challenges for automotive industry - Micro- and nanoscale characterization", 31th August, 2018, Dresden, Germany
 
: Mohammadian Kia, Alireza; Esmaeili, Sajjad; Mart, Clemens; Utriainen, Mikko; Haufe, Nora; Puurunen, Riikka L.; Weinreich, Wenke

2018, 1 Folie
Nanoanalysis Symposium <6, 2018, Dresden>
English
Poster
Fraunhofer IPMS ()
Anfrage beim Institut / Available on request from the institute bibliothek@ipms.fraunhofer.de

: http://publica.fraunhofer.de/documents/N-538065.html