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Proton testing of the NXP P4080 processor at the COSY accelerator

Paper presented at RADECS 2018 Data Workshop DW-7, Gothenburg, 16th - 21st September 2018
 
: Höffgen, Stefan; Liebender, Mirko; Baum, Max; Carl, Christopher; Felden, Olaf; Kündgen, Tobias; Lennartz, Wilhelm; Metzger, Stefan; Plettner, Samuel; Schön, Friedrich

:
Fulltext urn:nbn:de:0011-n-5376119 (253 KByte PDF)
MD5 Fingerprint: f44250b0d894d973fec49fc265c5e127
Created on: 20.3.2019


2018, 3 pp.
European Conference on RADiation Effects on Components and Systems (RADECS) <2018, Gothenburg>
English
Conference Paper, Electronic Publication
Fraunhofer INT ()
Fraunhofer FOKUS ()
SEE; proton; P4080

Abstract
The NXP P4080 ist tested for SEE using a proton beam of up to 500 MeV. Single and multiple bit upsets of the L2/L3 cache were measured as well as core crashes with different signatures.

: http://publica.fraunhofer.de/documents/N-537611.html