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Stress mapping by confocal raman spectroscopy on solar cells and modules

 
: Beinert, Andreas J.; Büchler, A.; Romer, P.; Heinrich, M.; Schubert, M.C.; Aktaa, J.; Eitner, U.

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Postprint urn:nbn:de:0011-n-5316043 (632 KByte PDF)
MD5 Fingerprint: 49020817936aa3e162ebb0b3d0e45e9e
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Created on: 29.1.2019


Institute of Electrical and Electronics Engineers -IEEE-:
IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 : A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC, 10-15 June 2018, Waikoloa Village, HI, USA
Piscataway, NJ: IEEE, 2018
ISBN: 978-1-5386-8529-7
ISBN: 978-1-5386-8530-3
pp.3613-3617
World Conference on Photovoltaic Energy Conversion (WCPEC) <7, 2018, Waikoloa/Hawaii>
Bundesministerium fur Wirtschaft und Energie BMWi (Deutschland)
0325825B
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()
stress; photovoltaic cell; finite element analysis; stress measurement

Abstract
In this work, we show the latest progress in the confocal micro-Raman spectroscopy for determination of stress within embedded solar cells. We present measurements proving that the module front glass has no influence on the stress measurement. We also present the first large area stress mapping on a quarter solar cell within a single-cell laminate. A stress map of the busbar end shows the superposition of the soldering induced tensile stress at the end of a busbar and the overall compressive stress from lamination. The stress mappings show the same trend as finite element simulations. We obtain a maximum relative compressive stress in the center of the laminated solar cell of about 50 MPa from the Raman spectroscopy and the FEM simulation.

: http://publica.fraunhofer.de/documents/N-531604.html