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Four-channel terahertz time-domain spectroscopy system for industrial pipe inspection

: Klier, Jens; Kharik, Dmytro; Zwetow, Wladimir; Gundacker, Dominic; Weber, Stefan; Molter, Daniel; Ellrich, Frank; Joachim Jonuscheit; Freymann, Georg von


Institute of Electrical and Electronics Engineers -IEEE-:
IRMMW-THz 2018, 43rd International Conference on Infrared, Millimeter, and Terahertz Waves : 9-14 September 2018, Nagoya Congress Center, Nagoya, Japan
Piscataway, NJ: IEEE, 2018
ISBN: 978-1-5386-3809-5
ISBN: 978-1-5386-3808-8
ISBN: 978-1-5386-3810-1
2 pp.
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <43, 2018, Nagoya>
Conference Paper
Fraunhofer ITWM ()

The measurement of layer thicknesses is one of the most promising fields of applications of terahertz measurement systems [1, 2]. Besides the investigation of coatings in the automotive or aeronautic industry, the inline inspection of wall thickness in pipe production processes is another highly interesting application scenario for terahertz technology. We present a four-channel terahertz time-domain spectroscopy systems developed for the inline measurement of pipe wall thickness measurements.