English
Deutsch
Log In
Password Login
or
Log in with Fraunhofer Smartcard
Research Outputs
Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Konferenzschrift
New method for characterizing the stability of µ-focus x-ray sources
Details
Full
Export
Statistics
Options
2005
Conference Paper
Titel
New method for characterizing the stability of µ-focus x-ray sources
Author(s)
Kostka, G.
Jobst, A.
Hauptwerk
Festsymposium 20 Jahre Fraunhofer IIS - Anwendungen der Mikroelektronik in der Informations- und Kommunikationstechnik
Konferenz
Festsymposium 20 Jahre Fraunhofer IIS "Anwendungen der Mikroelektronik in der Informations- und Kommunikationstechnik" 2005
Anniversary Symposium 20 Years Fraunhofer IIS "Microelectronics Applications for Information and Communication Technology" 2005
Language
English
google-scholar
View Details
Fraunhofer-Institut für Integrierte Schaltungen IIS