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Terahertz time-domain spectroscopy for non-destructive testing

 
: Globisch, B.; Nellen, S.; Kohlhaas, R.B.; Liebermeister, L.; Schell, M.

:

Sadwick, L.P. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI : 29 January-1 February 2018, San Francisco, California, United States
Bellingham, WA: SPIE, 2018 (Proceedings of SPIE 10531)
ISBN: 978-1-5106-1548-9
ISBN: 978-1-5106-1547-2
Paper 105310O, 7 pp.
Conference "Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications" <11, 2018, San Francisco/Calif.>
Conference "Optoelectronics, Photonic Materials and Devices" <2018, San Francisco/Calif.>
Photonics West Conference <2018, San Francisco/Calif.>
English
Conference Paper
Fraunhofer HHI ()

Abstract
We present terahertz (THz) time-domain spectroscopy (TDS) as a versatile tool for applications in non-destructive testing. Due to fiber-coupled THz systems, which exploit the advantages of mature telecommunication technology, THz- TDS is a promising tool for industrial process control. As an example, we demonstrate thickness measurements on multilayered plastic pipes by combining THz reflection measurements with a transfer matrix method for data evaluation. Furthermore, we show the potential of THz-TDS for time resolved 2D imaging. For this, we combine a photoconductive near-field probe with a commercially available fiber-coupled THz TDS system. Due to the coherent measurement scheme, which provides amplitude and phase information at each sampling point, in combination with an acquisition rate of 40 pulse traces per second, dynamic processes on the picosecond timescale can be monitored with unprecedented resolution. Exemplarily, we visualize the propagation of a THz-wave on the surface a of photoconductive THz emitter with a lateral resolution of 20 μm and sub-picosecond temporal resolution.

: http://publica.fraunhofer.de/documents/N-520753.html