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Lifetime modelling and geometry optimization of meander tracks in stretchable electronics

 
: Grams, A.; Kuttler, S.; Löher, T.; Walter, H.; Wittier, O.; Lang, K.-D.

:

Driel, W.D. van (Ed.) ; Institute of Electrical and Electronics Engineers -IEEE-:
19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018 : 15-18 April 2018, Toulouse, France
Piscataway, NJ: IEEE, 2018
ISBN: 978-1-5386-2358-9
ISBN: 978-1-5386-2359-6
ISBN: 978-1-5386-2360-2
pp.177-181
International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) <19, 2018, Toulouse>
English
Conference Paper
Fraunhofer IZM ()

Abstract
In stretchable electronics, meander designs are often used for the conducting traces. This geometry of the copper traces, that are much stiffer than the polymer substrates, allows for better stretchability. In order to be able to assess the meander reliability in a quantitative way, the possibilities and obstacles of finite element model based lifetime prediction have been investigated. Therefore, a parametric FE model of a test structure including a copper meander track has been set up and evaluated for the resulting mechanical stresses and strains under tensile loads. The comparison to experiments allowed to create a lifetime model and then perform a virtual optimization to find the best design.

: http://publica.fraunhofer.de/documents/N-520336.html