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Multilayer Laue Lenses (MLL) with 45 mm focal length as optics for in-situ nanoindentation experiments

 
: Kubec, Adam; Niese, Sven; Gluch, Jürgen; Rosenthal, Martin; Todt, Juraj; Keckes, Jozef; Gawlitza, Peter

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Microscopy and microanalysis 24 (2018), Supplement S2, pp.436-437
ISSN: 1431-9276
International Conference on X-Ray Microscopy (XRM) <14, 2018, Saskatoon/Canada>
English
Journal Article, Conference Paper
Fraunhofer IWS ()
Fraunhofer IKTS ()

: http://publica.fraunhofer.de/documents/N-515842.html