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Modeling the rate-dependent inelastic deformation of porous polycrystalline silver films

Presentation held at ESREF 2018, 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Aalborg, Denmark, October 1-5, 2018
 
: Letz, Sebastian; Farooghian, Azin; Simon, Flaviu-Bogdan; Schletz, Andreas

:
presentation urn:nbn:de:0011-n-5153240 (884 KByte PDF)
MD5 Fingerprint: 0cea38df941ff20d9d3d31a66c09abf6
Created on: 24.10.2018


2018, 16 Folien
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) <29, 2018, Aalborg>
English
Presentation, Electronic Publication
Fraunhofer IISB ()

: http://publica.fraunhofer.de/documents/N-515324.html