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Surface characterization with nanometer lateral resolution using the vibration modes of atomic force microscope cantilevers

: Rabe, U.; Arnold, W.; Caron, A.; Hirsekorn, S.; Schwarz, K.

Fulltext urn:nbn:de:0011-n-511446 (958 KByte PDF)
MD5 Fingerprint: cc1375d21dca84fe8ee9d695964592d0
Created on: 27.8.2009

Deutsche Gesellschaft für Zerstörungsfreie Prüfung e.V. -DGZfP-, Berlin; European Federation for Non-Destructive Testing -EFNDT-:
9th European Conference on NDT. ECNDT Berlin 2006. CD-ROM : September 25 - 29, 2006
Berlin: DGZfP, 2006 (DGZfP Proceedings BB 103-CD)
ISBN: 3-931381-86-2
European Conference on NDT (ECNDT) <9, 2006, Berlin>
Conference Paper, Electronic Publication
Fraunhofer IZFP ()
Atomic Force Acoustic Microscopy; atomic force microscopy; elasticity; ultrasonic

The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe echniques to ultrasonics. Atomic force acoustic microscopy (AFAM) and lateral atomic force acoustic microscopy are techniques which use the vibration modes of AFM cantilevers. In the AFAM-mode the cantilever is vibrating in one of its flexural resonances while the sensor tip is continuously in contact with the sample surface. With this imaging technique a contrast can be obtained which depends on the elasticity of the sample surface. Quantitative values of a local elastic constant can be obtained. Shear stiffness and friction phenomena can be investigated in ultrasonic friction force microscopy by evaluating the torsional resonances of AFM cantilevers.