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An open source based repository for defects in silicon

: Juhl, Mattias K.; Heinz, Friedemann D.; Coletti, Gianluca; Macdonald, Daniel; Rougieux, Fiacre E.; Schindler, Florian; Niewelt, Tim; Schubert, Martin C.

Postprint urn:nbn:de:0011-n-5074112 (540 KByte PDF)
MD5 Fingerprint: c528f06b4c8c4a9083a87e577ee66d26
Created on: 8.9.2018

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 : A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC, 10-15 June 2018, Waikoloa Village, HI, USA
Piscataway, NJ: IEEE, 2018
ISBN: 978-1-5386-8529-7
ISBN: 978-1-5386-8530-3
World Conference on Photovoltaic Energy Conversion (WCPEC) <7, 2018, Waikoloa/Hawaii>
Photovoltaic Specialists Conference (PVSC) <45, 2018, Waikoloa/Hawaii>
Photovoltaic Science and Engineering Conference (PVSEC) <28, 2018, Waikoloa/Hawaii>
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <34, 2018, Waikoloa/Hawaii>
Bundesministerium für Bildung und Forschung BMBF
01DR17019; CCPV
Conference Paper, Electronic Publication
Fraunhofer ISE ()
semiconductor impurities; database; photovoltaic cell; silicon; Photovoltaik; Silicium-Photovoltaik; Charakterisierung von Prozess- und Silicium-Materialien

Silicon is the most studied semiconductor, having almost every aspect of it being investigated. All this information is spread over a large set of publications, review articles and textbooks and cannot be found in a single location. Furthermore, the available data is not always consistent and depends on the techniques and samples used. This problem even exists for more specialised areas such as the study of defects in silicon photovoltaics, which is the focus of this paper. Currently, if a signature of a defect is experimentally determined a literature search must then be performed through texts going back decades in the hope to find a defect with similar properties. This paper addresses this time consuming activity by introducing an open source text based repository, which anyone can access or contribute to, and that provides clearly arranged information about defects in silicon.