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High-speed, high-resolution magnetic flux leakage inspection of large flat surfaces

: Szielasko, K.; Kloster, A.; Dobmann, G.; Scheel, H.; Hillemeier, B.

Fulltext urn:nbn:de:0011-n-505032 (2.8 MByte PDF)
MD5 Fingerprint: 58b109f79a6f043f0b4a97ae8d962e3b
Created on: 11.7.2008

Deutsche Gesellschaft für Zerstörungsfreie Prüfung e.V. -DGZfP-, Berlin; European Federation for Non-Destructive Testing -EFNDT-:
9th European Conference on NDT. ECNDT Berlin 2006. CD-ROM : September 25 - 29, 2006
Berlin: DGZfP, 2006 (DGZfP Proceedings BB 103-CD)
ISBN: 3-931381-86-2
European Conference on NDT (ECNDT) <9, 2006, Berlin>
Conference Paper, Electronic Publication
Fraunhofer IZFP ()
magnetic flux leakage (MFL); sensor; high resolution; quick inspection

Magnetic Flux leakage (MFL) inspection of flat surfaces can be done by scanning the areas of interest with magnetoresistive or Hall effect sensors. However, most applications require short measuring times which may not be achieved by scanning the area of interest with a single sensor. The common solution to this problem is the use of sensor arrays in the shape of a straight line or a matrix of elements. However, the local resolution is then limited by the sensor spacing within the line or matrix. Due to the scattering of sensor properties, accurate procedures for calibration or compensation are required in order to adjust the array to a homogeneous sensitivity and offset. This task is of particular importance when longterm changes and temperature dependence of the sensor properties have to be taken into consideration. This paper discusses a new approach to MFL testing of flat surfaces which reaches high speed and high local resolution with a small amount of sensors and implicitly compensates for different sensor properties during the measurement. Thereby, a quick inspection of even meter- to kilometer-sized surfaces becomes possible with local resolutions of 1 cm² and below. As a side-effect, reduced production costs may be obtained as compared to the costs of a sensor array of same resolution and accuracy.