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Environmental testing, corrosion, failure analysis. Power electronics in harsh environments

Presentation held at SEMICON West 2018, July 10-12, 2018, San Francisco, California

presentation urn:nbn:de:0011-n-5040941 (2.6 MByte PDF)

MD5 Fingerprint: 20770f6c87d7bc0b606abc31f26fdf33

Created on: 7.8.2018

	2018, 16 Folien Conference and Expo "SEMICON West" <2018, San Francisco/Calif.>

	English
	Presentation, Electronic Publication
	Fraunhofer IISB ()
	Forschungsfabrik Mikroelektronik Deutschland; environmental testing; corrosion; failure analysis; power electronics; harsh environment; environment