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Universal test system for system embedded optical interconnect

 
: Pitwon, Richard; Wang, Kai; Immonen, Marika; Schröder, Henning; Neitz, Marcel

:

Schröder, H. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Optical Interconnects XVIII : 27 January - 1 February 2018, San Francisco, California, United States
Bellingham, WA: SPIE, 2018 (Proceedings of SPIE 10538)
Paper 1053804, 10 pp.
Conference "Optical Interconnects" <18, 2018, San Francisco/Calif.>
English
Conference Paper
Fraunhofer IZM ()

Abstract
We introduce a universal test and measurement system allowing comparative characterisation of optical transceivers, board-to-board optical connectors and both embedded and passive optical circuit boards. The system comprises a test enclosure with interlocking and interchangeable test cards, allowing different technologies spanning different Technology Readiness Levels to be both characterised alone and in combination with other technologies. They form part of the open test design standards portfolio developed on the FP7 PhoxTroT and H2020 COSMICC projects and allow testing on a common test platform.

: http://publica.fraunhofer.de/documents/N-503649.html