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Injection dependent carrier density imaging measurements including correction for trapping effects

 
: Schubert, M.C.; Isenberg, J.; Rein, S.; Bermejo, S.; Glunz, S.W.; Warta, W.

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Fulltext urn:nbn:de:0011-n-503060 (PDF)
MD5 Fingerprint: de46452c42d7cbd5e5146ea611005e61
Created on: 12.10.2012


20th European Photovoltaic Solar Energy Conference 2005. Proceedings : Barcelona, 6-10 June 2005
München: WIP-Renewable Energies, 2005
ISBN: 3-936338-19-1
pp.1202-1205
European Photovoltaic Solar Energy Conference <20, 2005, Barcelona>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()

Abstract
Injection dependent lifetime measurements are often severely affected by trapping effects, resulting in an anomalous increase of lifetime under low-injection conditions. Carrier Density Imaging (CDI) measurements are presented where trapping effects are clearly present. Two different correction methods are proposed, based on the modeling of the injection dependent data. A model for CDI measurements, based on the Hornbeck-Haynes model is proposed as well as a bias-light correction adapted to CDI. Finally, a modification of the CDI setup is presented which allows to suppress trapping effects very efficiently. It is based on an additional irradiation with sub-bandgap light which is assumed to deplete trap levels resulting in trap-free lifetime measurements. A comparison of the carrier lifetimes resulting from these methods shows excellent correlation.

: http://publica.fraunhofer.de/documents/N-50306.html