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Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current

 
: Buonassisi, T.; Istratov, A.A.; Pickett, M.D.; Marcus, M.A.; Hahn, G.; Ciszek, T.F.; Riepe, S.; Isenberg, J.; Warta, W.; Schindler, R.; Willeke, G.; Weber, E.R.

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Applied Physics Letters 87 (2005), No.4, Art. 044101, 3 pp.
ISSN: 0003-6951
ISSN: 1077-3118
English
Journal Article
Fraunhofer ISE ()

: http://publica.fraunhofer.de/documents/N-49724.html