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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Investigation of InxGa1-xN islands with electron microscopy

 
: Pretorius, A.; Yamaguchi, T.; Schowalter, M.; Kröger, R.; Kübel, C.; Hommel, D.; Rosenauer, A.

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Cullis, A.G.:
Microscopy of semiconducting materials : Proceedings of the 14th conference, April 11 - 14, 2005, Oxford, UK
Berlin: Springer, 2005 (Springer Proceedings in Physics 107)
ISBN: 3-540-31914-X
pp.17-20
Conference on Microscopy of Semiconducting Materials (MSM) <14, 2005, Oxford>
English
Conference Paper
Fraunhofer IFAM ()

: http://publica.fraunhofer.de/documents/N-49378.html