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Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications
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2005
Journal Article
Titel
Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications
Author(s)
Kübel, C.
Voigt, A.
Schoenmakers, R.
Otten, M.
Su, D.
Lee, T.-C.
Carlsson, A.
Bradley, J.
Zeitschrift
Microscopy and microanalysis
DOI
10.1017/S1431927605050361
Language
English
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Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM