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Comprehensive radiation characterization of digital isolators

: Wind, Michael; Bagalkote, Jayasimha; Clemens, Peter; Kündgen, Tobias; Latocha, Marcin; Lennartz, Wilhelm; Metzger, Stefan; Poizat, Marc; Ruge, Sven; Steffens, Michael; Beck, Peter

Postprint urn:nbn:de:0011-n-4848475 (1.1 MByte PDF)
MD5 Fingerprint: 99fe496d9dc283c8768ef5136b3647aa
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Created on: 9.3.2018

Institute of Electrical and Electronics Engineers -IEEE-:
16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 : September 19-23, 2016, Bremen, Germany
Piscataway, NJ: IEEE, 2016
ISBN: 978-1-5090-4366-8
ISBN: 978-1-5090-4367-5
European Conference on Radiation and its Effects on Components and Systems (RADECS) <16, 2016, Bremen>
European Space Agency ESA
4000112480/14/NL/SW; REDI
Radiation Evaluation of Digital Isolators
Conference Paper, Electronic Publication
Fraunhofer INT ()

We investigate TID radiation response and SEE susceptibility of six different digital isolators by exposing them to Co-60 gammas with 300 krad(Si) and various proton and heavy ion fields with LET of up to 60 MeV·mg-1·cm2. The type with the least radiation degradation was also exposed to 10 MeV electrons and 14 MeV neutrons.